Scanning Electron Microscopy, SEM Analysis

Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. AMRC uses SEM analysis in cases where optical microscopy cannot provide sufficient image resolution or high enough magnification. Applications include failure analysis, dimensional analysis, process characterization, reverse engineering, and particle identification. There is also equipment for coating of insulator samples on-hand. AMRC's expertise and range of experience is invaluable to the industries and customers we serve. Person-to-person service ensures good communication of the results and their implications. Customers are often present during the analysis, enabling an immediate sharing of data, imaging and information.

Ideal Uses

High resolution images

particle characterization

Technical specifications

Signal Detected: Secondary & backscattered electrons and x-rays, absorbed current, light (Cathodoluminescence) and induced current (EBIC)

Detection Limits: 0.1-1at%

Imaging: Yes

Lateral Resolution/Probe Size: 15-45Å


  • Rapid, high-resolution imaging
  • Quick identification of elements present
  • Good depth of field
  • Versatile platform that supports many other tools



  • Vacuum compatibility typically required
  • May need to etch for contrast
  • SEM may spoil sample for subsequent analyses
  • Size restrictions may require cutting the sample
  • Ultimate resolution is a strong function of the sample and preparation

Industries served

  • Aerospace
  • Automotive
  • Biomedical/biotechnology
  • Compound Semiconductor
  • Data Storage
  • Defense
  • Displays
  • Electronics
  • Industrial Products
  • Lighting
  • Pharmaceutical
  • Photonics
  • Polymer
  • Semiconductor
  • Solar Photovoltaics
  • Telecommunications


Developed by: Pourya Zarini - 2014

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P.O.Box: 85141-43131 Tel: +98-31-42291111